Parallel 12 Channel TCSPC System

  • 12 Parallel SPC-150NX Modules in 19" Case
  • High-Throughput Rate
  • No Crosstalk Between Channels
  • Excellent Time Resolution
  • Internal Timing Jitter 1.6 ps RMS (3.5 ps FWHM)
  • Minimum Time Channel Width 407 ps
  • Ultra-High IRF Stability
  • Input Discriminator Bandwidth 4 GHz
  • Saturated Count Rate 10 MHz per Channel

Photon Channel

 

Principle

Constant Fraction Discriminator (CFD)

Discriminator Input Bandwidth

4 GHz

Time Resolution (FWHM/RMS, electr.)

< 3.5 ps / 1.6 ps

Variance in Time of IRF centroid

< 0.4 ps RMS over 100 s

Optimum Input Voltage Range

-30 mV to -500 mV

Min. Input Pulse Width

200 ps

Threshold

0 to -250 mV

Zero Cross Adjust

-100 mV to 100 mV

Synchronisation Channel

 

Principle

Constant Fraction Discriminator (CFD)

Discriminator Input Bandwidth

4 GHz

Optimum Input Voltage Range

-30 mV to -500 mV

Min. Input Pulse Width

200 ps

Threshold

0 to -250 mV

Frequency Range

0 to 150 MHz

Frequency Divider

1, 2, 4

Zero Cross Adjust

-100 mV to 100 mV

Time-to-Amplitude Converters / ADCs

 

Principle

Ramp Generator / Biased Amplifier

TAC Range

25 ns to 2.5 µs

Biased Amplifier Gain

1 to 15

Biased Amplifier Offset

0 % to 50 % of TAC Range

Time Range incl. Biased Amplifier

1.67 ns to 2.5 µs

Min. Time Channel Width

407 fs

ADC Principle

50 ns Flash ADC with Error Correction

Diff. Nonlinerarity

< 0.5 % RMS, typ. < 1 % peak-peak

Data Acquisition

Histogram Mode

Method

on-board multi-dim. histogramming process

Dead Time

100 ns, independent of computer speed

Saturated Count Rate (Each Channel)

10 MHz

Useful Count Rate (Each Channel)

5 MHz

Max. Counts / Time Channel

16 bits

Overflow Control

none, stop, repeat and correct

Collection Time

0.1 µs to 100,000 s

Diplay Interval Time

10 ms to 100,000 s

Repeat Time

0.1 µs to 100,000 s

Sequencing Recording

Programmable Hardware Sequencer, unlimited recording by Memory swapping, in curve mode and scan mode

Synchronisation with Scanning

Pixel, Line and Frame from Scanning Device

Routing

7 bit, TTL

Experiment Trigger

TTL

Data Acquisition

FIFO / Parameter-Tag Mode

Method

Time and wavelength tagging of individual photons and continuous writing to disk

Online Display

Decay functions, FCS, Cross-FCS, PCH MCS Traces

FCS Calculation

Multi-tau algorithm, online calculation and online fit

Number of counts of decay/ waveform recording

unlimited

Dead Time

100 ns

Saturated Count Rate, Peak (Each Channel)

10 MHz

Max. Counts / Time Channel (Counting Depth)

unlimited

Output Data Format (ADC / Macrotime / Routing)

12 / 12 / 4

FIFO Buffer Capacity (Photons)

2 * 106

Macro Timer Resolution, Internal Clock

50 ns, 12 bit, overflows marked by MOTF entry in data stream

Input Macro Timer Resolution, Clock from Sync

10 ns to 100 ns, 12 bit, overflow marked by MOTF entry in data stream

Input Curve Control (external Routing)

4 bit, TTL

External Event Markers

4 bit, TTL

Enable Count Control

1 bit, TTL

Input Experiment Trigger

TTL

Computer Interface

 

Principle High-Speed Parallel Interface

 

The bh TCSPC Handbook
8th edition, corrected and updated September 2019

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