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NSOM FLIM with the Nanonics AFM/NSOM System

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We present an NSOM FLIM system based on the AFM/NSOM system of Nanonics Imaging, Jerusalem, and a Simple-Tau 150 TCSPC FLIM system of Becker & Hickl, Berlin. The system is able to record FLIM data at high pixel numbers, and with a full fluorescence decay function in each pixel. We demonstrate the system for recording FLIM of nano-islands on a semiconductor surface.

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