Back to Application Notes

NSOM FLIM with the Nanonics AFM/NSOM System

We present an NSOM FLIM system based on the AFM/NSOM system of Nanonics Imaging, Jerusalem, and a Simple-Tau 150 TCSPC FLIM system of Becker & Hickl, Berlin. The system is able to record FLIM data at high pixel numbers, and with a full fluorescence decay function in each pixel. We demonstrate the use of the system system for recording FLIM of nano-islands on a semiconductor surface.

Download Application Note

© 2019 Becker & Hickl GmbH. All rights reserved.

Privacy PolicyImprint