SPC-180N TCSPC Series

High-Throughput PCIe Interface
Unprecedented Time Resolution and Excellent Timing Stability
Time Channel Width Down to 203 fs
Internal Timing Jitter (RMS) / IRF Width (FWHM) Down to 1.1 ps / 2.8 ps
12 MHz Saturated Count Rate
-NX and -NXX Versions Ideal for Ultra-Fast HPM (Hybrid) Detectors and Superconducting NbN Detectors
Precision Fluorescence Decay Recording
High-Resolution FLIM, Simultaneous FLIM/PLIM and Multi-Wavelength FLIM
Photon Correlation, Single-Molecule Spectroscopy
Free Instrument Software for Windows 10/11
Realtime Calculation of FLIM Images, FCS Curves and Decay Curves from FLIM ROIs
Realtime Fit of FCS Curves
Link to SPCImage NG Data Analysis
Parallel Operation of Up to 4 Modules
Available as Multi-Module Package, e.g. SPC-182NX, SPC-183NX and SPC-184NX

Description

The SPC-180N is a high-end performance module for fluorescence lifetime imaging micrscopy (FLIM) with high-time resolution. The board can be used for fluorescence lifetime measurements, single molecule spectroscopy, FCS and FCCS recording, FLIM, Mosaic FLIM, FLITS, and combined FLIM / PLIM applications. This module is also the basis of FLIM upgrades for various scanning microscopes.

General Information

The SPC-180N modules have ultra-fast timing electronics equivalent to those of the SPC‑150N series. The modules are available in three versions with different time range and time resolution:

Minimum Time Channel Width
SPC-180N: 813 fs
SPC-180NX: 405 fs
SPC-180NXX: 203 fs

Internal Timing Jitter (RMS) / IRF Width (FWHM)
SPC-180N: 2.5 ps / 6.6 ps
SPC-180NX: 1.6 ps / 3.5 ps
SPC-180NXX: 1.1 ps / 2.8 ps

The -NX version, and, especially, the -NXX version have been designed for ultra-fast detectors, SSPDs and ultra-fast hybrid detectors.
All SPC-180N series modules have high-speed PCI-Express (PCIe) interfaces. The new interface achieves extremely high data transfer rates. With the SPC-180N series modules, bus saturation and FIFO overflow in fast FLIM applications are unlikely to occur. To further facilitate fast FLIM, the modules of the SPC-180N series have a fast counter in parallel to the TCSPC timing electronics. This allows the data acquisition software to build up FLIM images, for which the intensity remains linear up to the highest count rates.

All SPC-180N family modules have high-speed PCI-Express (PCIe) interfaces and can be easily installed in nearly all PCs or configured as stand-alone timing unit.

Measurement Software Included

The SPCM operating and measurement software is included with all SPC series modules. SPCM provides online calculation and display (2D, 3D) of data (decay curves, FLIM, FCS, FCCS) acquired in multiple operation modes. SPCM software undergoes active continuous development. SPCM receives frequent updates with new features and bug fixes. Read more…

FLIM and FCS Data Analysis

For advanced fluorescence lifetime imaging (FLIM) and single-curve data analysis, please use SPCImage.
For advanced fluorescence correlation spectroscopy (FCS) and cross-correlation (FCCS) data analysis, please use Burst Analyzer.

Custom Programming Libraries (DLL, LabVIEW)

For automation and custom software integration, DLLs and LabVIEW drivers are available. Read more…

Specifications

	SPC-180N	SPC-180NX		SPC-180NXX
Photon Channel
Principle	Constant Fraction Discriminator (CFD)
Discriminator Input Bandwidth	4 GHz
Time Resolution (FWHM/RMS, electr.)	6.6 ps / 2.5 ps	< 3.5 ps / 1.6 ps		< 3 ps / 1.1 ps
Variance in Time of IRF max. (RMS)	< 0.4 ps over 100 s
Optimum Input Voltage Range	-30 mV to -500 mV
Min. Input Pulse Width	200 ps
Threshold	0 to -250 mV
Zero Cross Adjust	-100 mV to 100 mV
Syncronisation Channel
Principle	Constant Fraction Discriminator (CFD)
Discriminator Input Bandwidth	4 GHz
Optimum Input Voltage Range	-30 mV to -500 mV
Min. Input Pulse Width	200 ps
Threshold	0 to -250 mV
Frequency Range	0 to 150 MHz
Frequency Divider	1, 2, 4
Zero Cross Adjust	-100 mV to 100 mV
Time-to-Amplitude Converters / ADCs
Principle	Ramp Generator / Biased Amplifier
TAC Range	50 ns to 5 µs	25 ns to 2.5 µs		12.5 ns to 50 ns
Biased Amplifier Gain	1 to 15
Biased Amplifier Offset (of TAC Range)	0 % to 50 %
Time Range incl. Biased Amplifier	3.3 ns to 5 µs	1.67 ns to 2.5 µs		0.834 ns to 50 ns
Min. Time Channel Width	813 fs	407 fs		203 fs
ADC Principle	50 ns Flash ADC with Error Correction
Diff. Nonlinerarity	< 0.5 % RMS, typ. < 1 % peak-peak
Data Acquisition	Histogram Mode
Method	on-board multi-dim. histogramming process
Dead Time	80 ns, independent of computer speed
Saturated Count Rate	12 MHz
Max. Counts / Time Channel	16 bits
Overflow Control	none, stop, repeat and correct
Collection Time	0.1 µs to 100,000 s
Diplay Interval Time	10 ms to 100,000 s
Repeat Time	0.1 µs to 100,000 s
Sequencing Recording	Programmable Hardware Sequencer, unlimited recording by Memory swapping, in curve mode and scan mode
Syncronisation with Scanning	Pixel, Line and Frame from Scanning Device
Routing	7 bit, TTL
Experiment Trigger	TTL
Data Acquisition	FIFO / Parameter-Tag Mode
Method	Time and wavelength tagging of individual photons and continuous writing to disk
Online Display	Decay functions, FCS, Cross-FCS, PCH MCS Traces
FCS Calculation	Multi-tau algorithm, online calculation and online fit
Number of Counts of Decay/ Waveform Recording	unlimited
Dead Time	80 ns
Saturated Count Rate, Peak	12 MHz
Sustained Count Rate (Bus Transfer Limit)	typ. 5 MHz
Max. Counts / Time Channel (Counting Depth)	unlimited
Output Data Format (ADC / Macrotime / Routing)	12 / 12 / 4
FIFO Buffer Capacity (Photons)	2 * 10⁶
Macro Timer Resolution, Internal Clock	25 ns, 12 bit, overflows marked by MOTF entry in data stream
Input Macro Timer Resolution, Clock from Sync	10 ns to 100 ns, 12 bit, overflow marked by MOTF entry in data stream
Input Curve Control (external Routing)	4 bit, TTL
External Event Markers	4 bit, TTL
Input Count Enable Control	1 bit, TTL
Input Experiment Trigger	TTL
Data Acquisition	FIFO / Parameter-Tag Imaging Mode
Method	Buildingup images from time- and wavelength tagged data
Online Display	up to 8 Images in different time and wavelength windows
Synchronisation with Scanner	via Frame Clock, Line Clock and Pixel Clock Pulses
Detector / Wavelength Channels	1 to 16
Image resolution (64-bit SPCM Software)
No. of Time Channels	64	256	1024		4096
No. of Pixels, 1 Detector Channel	4096 x 4096	2048 x 2048	1024 x 1024		512 x 512
No. of Pixels, 16 Detector Channels	1024 x 1024	512 x 512	256 x 256		128 x 128
Operation Environment
PC System	Windows 8 / 10, > 8 GB RAM, 64 bit operating system recommended
PC Interface	PCIe
Power Consumption	approx. 12 W from +12 V
Dimensions	230 mm x 130 mm x 18 mm

Downloads

Documents

The bh TCSPC Handbook
9th edition, September 2021

View

Datasheets

Manuals

Software

Data Acquisition and Analysis Software with DLL

TCSPC Package 7.0 64-bit

Fast Online Video FLIM Streaming

ExpressFLIM

Visualisation and Analysis Software of Dynamic Effects

SPCDynamics

Analysis Software for FCS and cross-FCS

Burst Analyzer 2.2

LabVIEW Instrument Library

LabVIEW SPC v27

Applications

Application Notes

Principles

The bh SPC modules use a multi-dimensional TCSPC principle. The principle is an extension of the classic TCSPC process: A detector detects single photons of a periodic light signal. The TCSPC electronics measures the times of the photons within the signal (excitation) period, and builds up the distribution of the photons over the time of the signal period. The time resolution of the TCSPC process is much higher than the resolution of an analog recording with the same detector: The time of a photon pulse can be determined with a much higher precision than its width.

In extension of the classic process, the bh technique determines additional parameters of the photons, such as wavelength, point of origin within an image area, excitation wavelength, time from an external stimulation of the sample, time within an additional modulation period of the excitation light. The photon distribution is built up over the photon times in the signal period and one or several of these additional parameters. The results of this process are multi-wavelength fluorescence-decay data, fluorescence-lifetime images, multi-wavelength lifetime images, multi-excitation decay data or multi-excitation FLIM data, decay data or FLIM data of fast dynamic changes within a sample, or combined fluorescence / phosphorescence decay data or FLIM / PLIM data. Please see also 'The bh TCSPC Technique'.